HAN Yinhe,HU Yun,LI Xiaowei,et al.Embedded test decompressor to reduce the required channels and vector memory of tester for complex processor circuit.IEEE Transactions on Very Large Scale Integration Systems,2007,15(5):531-540. MIRTHULLA S,ARULMURUGAN A.Improvement of test data compression using combined encoding//Proceedings of International Conference on Electronics and Communication Systems.Washington D.C.,USA:IEEE Press,2015:164-167. WANG L T,STROUD C E,TOUBA N A.System-on-chip test architectures:nanometer design for testability.San Francisco,USA:Morgan Kaufmann,2010. Key words: test data compression, tri-state signal, run length coding, variable length segment compression, Automatic Test Equipment(ATE) Finally,the flag bits are encoded with tri-state signals,and the encoded and compressed test set is saved into the Automatic Test Equipment(ATE).The compressed data in ATE can be decompressed without loss by designing a decompression circuit.Experimental results show that the proposed method improves the average compression ratio to 74.39% without a significant increase in the hardware overhead,which is better than other similar compression methods. To improve the efficiency of integrated circuit testing,this paper proposes an improved run length coding compression method using tri-state signal.First,part of the input in the test cube is reduced,and the unrelated bits of the test set are filled.Then the variable length segment compression is performed on the pre-processed test set according to the run length to find the optimal segment length.According to the frequency of the run length,the encoding table is designed for the reference bits under the optimal segment length for coding compression.
0 Comments
Leave a Reply. |